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Please use this identifier to cite or link to this item: http://hdl.handle.net/2307/216

Title: M3M45M45 Auger lineshape measured from the Cu(111) surface: Multiplet term selectivity in angle-resolved Auger-photoelectron coincidence spectroscopy
Authors: Gotter, R.
Da Pieve, F.
Offi, Francesco
Ruocco, Alessandro
Verdini, A.
Yao, H.
Bartynski, R.
Stefani, Giovanni
Keywords: 2-STEP DOUBLE PHOTOIONIZATION
X-RAY
FINE-STRUCTURE
ELECTRON DIFFRACTION
CIRCULAR-DICHROISM
LINE-SHAPES
AUGER
CU(111)
PHOTOEMISSION
COPPER
Issue Date: Feb-2009
Publisher: American Physical Society
Abstract: The capability of the recently observed dichroic effect inangle-resolved Auger-photoelectron coincidence spectroscopy (DEAR-APECS) to disentangle individual multiplet terms has been exploited to study the lineshape of the M3M45M45 Auger spectrum measured in coincidence with the 3p(3/2) photoelectrons from theCu(111) surface. The relevant multiplet structure of the two hole final state is determined with an unprecedented sensitivity, including are liable experimental estimation of the energy of t
...more
URI: http://hdl.handle.net/2307/216
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.79.075108
Appears in Collections:A - Articolo su rivista
Dipartimento di Fisica 'Edoardo Amaldi'

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